A cryostatic setup for the low-temperature measurement of thermal diffusivity with the photothermal method

被引:10
作者
Bertolotti, M
Liakhou, G
Voti, RL
Paoloni, S
Sibilia, C
Sparvieri, N
机构
[1] CNR,GNEQP,I-00185 ROME,ITALY
[2] INFM,ROME,ITALY
[3] TECH UNIV MOLDOVA,KISHINEV 277012,MOLDOVA
[4] ALENIA,I-00131 ROME,ITALY
关键词
D O I
10.1063/1.1146026
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A cryostatic setup is described to perform photothermal deflection measurements from room temperature to 77 K. The setup uses gaseous nitrogen as a medium where the photodeflection is produced. The ability of the system to work is demonstrated presenting some measurements of thermal diffusivity of high-temperature superconductor samples and of yttrium-iron garnets with variable aluminum content. (C) 1995 American Institute of Physics.
引用
收藏
页码:5598 / 5602
页数:5
相关论文
共 8 条
[1]   ON THE PHOTODEFLECTION METHOD APPLIED TO LOW THERMAL-DIFFUSIVITY MEASUREMENTS [J].
BERTOLOTTI, M ;
VOTI, RL ;
LIAKHOU, G ;
SIBILIA, C .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (06) :1576-1583
[2]  
BERTOLOTTI M, 1989, FUSION TECHNOLOGY
[3]   PHOTOTHERMAL DEFLECTION SPECTROSCOPY AND DETECTION [J].
JACKSON, WB ;
AMER, NM ;
BOCCARA, AC ;
FOURNIER, D .
APPLIED OPTICS, 1981, 20 (08) :1333-1344
[4]  
LIDE R, 1993, HDB CHEM PHYSICS
[5]  
NILSEN WG, 1965, PHYS REV A, V139, P472
[6]  
Shchelkotunov V. A., 1973, Inorganic Materials, V9, P597
[7]  
Touloukian Y.S., 1973, THERMOPHYSICAL PROPE, V10
[8]  
Uher C, 1992, PHYSICAL PROPERTIES, V3, P159