IMPROVED LEED SYSTEM USING POSITION-SENSITIVE DETECTION

被引：7

作者：

MALIC, RA

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1988年 / 59卷 / 09期

关键词：

D O I：

10.1063/1.1140057

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1951 / 1953

页数：3

共 10 条

[1]

ERB L, COMMUNICATION

[2]

KROPFL WJ, COMMUNICATION

[3] INSTRUMENTATION FOR LOW-ENERGY ELECTRON-DIFFRACTION [J].

LAGALLY, MG ;

MARTIN, JA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (10) :1273-1288

[4] LOW-ENERGY ELECTRON-DIFFRACTION OBSERVATIONS ON AU-ENRICHED NI-0.8-PERCENT-AU ALLOY(110) SURFACES PREPARED BY SURFACE SEGREGATION [J].

MCRAE, EG ;

MALIC, RA .

SURFACE SCIENCE, 1986, 177 (01) :53-73

[5] LOW-ENERGY ELECTRON-DIFFRACTION SYSTEM USING A POSITION-SENSITIVE DETECTOR [J].

MCRAE, EG ;

MALIC, RA ;

KAPILOW, DA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (11) :2077-2083

[6] OBSERVATIONS OF THE CU3AU(001) PHASE-TRANSITION USING A NOVEL LOW-ENERGY ELECTRON-DIFFRACTION SYSTEM [J].

MCRAE, EG ;

MALIC, RA .

SURFACE SCIENCE, 1984, 148 (2-3) :551-580

[7] A NEW PHASE-TRANSITION AT THE GE(111) SURFACE OBSERVED BY LOW-ENERGY ELECTRON-DIFFRACTION [J].

MCRAE, EG ;

MALIC, RA .

PHYSICAL REVIEW LETTERS, 1987, 58 (14) :1437-1439

[8] LOW-ENERGY ELECTRON-DIFFRACTION WITH POSITION-SENSITIVE DETECTION - INTENSITY MEASUREMENTS AND COMPARISON WITH POSITRON DIFFRACTION FOR NAF(001) [J].

MCRAE, EG ;

MALIC, RA .

SURFACE SCIENCE, 1986, 177 (01) :74-89

[9]

MCRAE EG, IN PRESS PHYS REV B

[10] A NEW LEED INSTRUMENT FOR QUANTITATIVE SPOT PROFILE ANALYSIS [J].

SCHEITHAUER, U ;

MEYER, G ;

HENZLER, M .

SURFACE SCIENCE, 1986, 178 (1-3) :441-451

← 1 →