A NEW LEED INSTRUMENT FOR QUANTITATIVE SPOT PROFILE ANALYSIS

[1] EPITAXY OF SI(111) AS STUDIED WITH A NEW HIGH RESOLVING LEED SYSTEM [J]. SURFACE SCIENCE, 1982, 117 (1-3) : 180 - 187

[2] GRONWALD KD, 1981, THESIS HANNOVER

[3] RESISTANCE BIAS CHARACTERISTIC OF THE ELECTRON MICROSCOPE GUN [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1958, 9 (12): : 482 - 486

[4] LEED STUDIES OF FIRST STAGES OF DEPOSITION AND MELTING OF LEAD ON LOW INDEX FACES OF COPPER [J]. SURFACE SCIENCE, 1972, 29 (01) : 20 - &

[5] DEFECTS AT SEMICONDUCTOR SURFACES [J]. SURFACE SCIENCE, 1985, 152 (APR) : 963 - 976

[6] LEED STUDIES OF SURFACE IMPERFECTIONS [J]. APPLICATIONS OF SURFACE SCIENCE, 1982, 11-2 (JUL): : 450 - 469

[7] LOW-ENERGY ELECTRON DIFFRACTION FROM IMPERFECT STRUCTURES [J]. SURFACE SCIENCE, 1970, 21 (02) : 209 - &

[8] JONA F, 1985, SPRINGER SERIES SURF, V2, P92

[9] THE PRESENT STATUS OF LOW-ENERGY ELECTRON-DIFFRACTION [J]. APPLICATIONS OF SURFACE SCIENCE, 1982, 13 (1-2): : 260 - 281

[10] INSTRUMENTATION FOR LOW-ENERGY ELECTRON-DIFFRACTION [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (10) : 1273 - 1288

[1] EPITAXY OF SI(111) AS STUDIED WITH A NEW HIGH RESOLVING LEED SYSTEM [J]. SURFACE SCIENCE, 1982, 117 (1-3) : 180 - 187

[2] GRONWALD KD, 1981, THESIS HANNOVER

[3] RESISTANCE BIAS CHARACTERISTIC OF THE ELECTRON MICROSCOPE GUN [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1958, 9 (12): : 482 - 486

[4] LEED STUDIES OF FIRST STAGES OF DEPOSITION AND MELTING OF LEAD ON LOW INDEX FACES OF COPPER [J]. SURFACE SCIENCE, 1972, 29 (01) : 20 - &

[5] DEFECTS AT SEMICONDUCTOR SURFACES [J]. SURFACE SCIENCE, 1985, 152 (APR) : 963 - 976

[6] LEED STUDIES OF SURFACE IMPERFECTIONS [J]. APPLICATIONS OF SURFACE SCIENCE, 1982, 11-2 (JUL): : 450 - 469

[7] LOW-ENERGY ELECTRON DIFFRACTION FROM IMPERFECT STRUCTURES [J]. SURFACE SCIENCE, 1970, 21 (02) : 209 - &

[8] JONA F, 1985, SPRINGER SERIES SURF, V2, P92

[9] THE PRESENT STATUS OF LOW-ENERGY ELECTRON-DIFFRACTION [J]. APPLICATIONS OF SURFACE SCIENCE, 1982, 13 (1-2): : 260 - 281

[10] INSTRUMENTATION FOR LOW-ENERGY ELECTRON-DIFFRACTION [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (10) : 1273 - 1288