PROFILING OF MICROMAGNETIC STRAY FIELDS IN FRONT OF MAGNETIC RECORDING MEDIA AND HEADS BY MEANS OF A SEM

被引：13

作者：

ELSBROCK, JB

BALK, LJ

机构：

[1] Univ Duisburg, Fachgebiet Werkstoffe, der Elektrotechnik, Duisburg, West, Ger, Univ Duisburg, Fachgebiet Werkstoffe der Elektrotechnik, Duisburg, West Ger

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1984年 / 20卷 / 05期

关键词：

D O I：

10.1109/TMAG.1984.1063315

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：866 / 868

页数：3

共 11 条

[1]

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[2]

ELSBROCK JB, 1984, SCANNING ELECTRON MI

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JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, 13 (03) :457-462

[4]

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WADE, RH .

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[6] OBSERVATION OF MICROSCOPIC DISTRIBUTION OF MAGNETIC-FIELDS BY ELECTRON HOLOGRAPHY [J].

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ENDO, J ;

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UMEZAKI, H ;

TANABE, H ;

SUGITA, Y ;

FUJIWARA, H .

JOURNAL OF APPLIED PHYSICS, 1982, 53 (08) :5444-5446

[7] SCANNING ELECTRON-MICROSCOPY OF TWO-DIMENSIONAL MAGNETIC STRAY FIELDS [J].

RAU, EI ;

SPIVAK, GV .

SCANNING, 1980, 3 (01) :27-34

[8] MAGNETIC FIELD MEASUREMENTS IN SCANNING ELECTRON MICROSCOPE [J].

THORNLEY, RF ;

HUTCHINS.JD .

APPLIED PHYSICS LETTERS, 1968, 13 (08) :249-&

[9] SCHLIEREN METHOD AS APPLIED TO MAGNETIC RECORDING-HEADS IN THE SCANNING ELECTRON-MICROSCOPE [J].

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BRUNNER, M .

APPLIED PHYSICS LETTERS, 1983, 42 (01) :114-116

[10]

WELLS OC, 1982, 19TH ANN C MAS PHOEN, P1

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