SPECKLE IMAGE EXPOSED TO 2 WAVELENGTHS APPLIED TO MEASUREMENT OF BEAM CURVATURE OF CYLINDRICAL SURFACE

被引：2

作者：

TRIBILLON, G ^{[1
]}

GARCIAGARCIA, M ^{[1
]}

机构：

[1] UNIV BESANCON,FAC SCI,PHYS GEN & OPT LAB,F-25030 BESANCON,FRANCE

来源：

OPTICS COMMUNICATIONS | 1977年 / 20卷 / 02期

关键词：

D O I：

10.1016/0030-4018(77)90339-X

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：229 / 233

页数：5

共 15 条

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