STEADY-STATE PHOTOCARRIER COLLECTION IN SILICON IMAGING DEVICES

被引：33

作者：

LAVINE, JP

TRABKA, EA

BURKEY, BC

TREDWELL, TJ

NELSON, ET

ANAGNOSTOPOULOS, C

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1983年 / 30卷 / 09期

关键词：

D O I：

10.1109/T-ED.1983.21268

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1123 / 1134

页数：12

共 48 条

[1]

AOKI M, 1982, IEEE J SOLID-ST CIRC, V17, P375

[2] THEORY OF LIFE TIME MEASUREMENTS WITH SCANNING ELECTRON-MICROSCOPE - STEADY-STATE [J].

BERZ, F ;

KUIKEN, HK .

SOLID-STATE ELECTRONICS, 1976, 19 (06) :437-445

[3] A METHOD FOR IMPROVING THE SPATIAL-RESOLUTION OF FRONTSIDE-ILLUMINATED CCDS [J].

BLOUKE, MM ;

ROBINSON, DA .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (03) :251-256

[4] INTRINSIC OPTICAL ABSORPTION IN GERMANIUM-SILICON ALLOYS [J].

BRAUNSTEIN, R ;

MOORE, AR ;

HERMAN, F .

PHYSICAL REVIEW, 1958, 109 (03) :695-710

[5]

Briggs R. J., 1981, International Electron Devices Meeting, P165

[6]

BUSS DD, 1976, IEEE J SOLID STATE C, V11

[7]

CARSLAW HS, 1959, CONDUCTION HEAT SOLI

[8] MTF SIMULATION INCLUDING TRANSMITTANCE EFFECTS AND EXPERIMENTAL RESULTS OF CHARGE-COUPLED IMAGERS [J].

CHAMBERLAIN, SG ;

HARPER, DH .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (02) :145-154

[9]

CHAMBERLAIN SG, 1978, IEEE T ELECTRON DEVI, V25

[10] SILICON DIODE ARRAY CAMERA TUBE [J].

CROWELL, MH ;

LABUDA, EF .

BELL SYSTEM TECHNICAL JOURNAL, 1969, 48 (05) :1481-+

← 1 2 3 4 5 →