X-RAY ORIENTATION TOPOGRAPHY

被引：13

作者：

CHIKAURA, Y

TAKATA, Y

机构：

[1] Department of Physics, Kyushu Institute of Technology, Tobata-ku, Kitakyushu

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1990年 / 29卷 / 02期

关键词：

Crystal orientation; Imaging; Iron-silicon alloy; X-ray orientation topography; X-ray scattering radiography;

D O I：

10.1143/JJAP.29.L378

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In order to observe orientation distribution in a single crystal, X-ray orientation topography has been devised by applying X-ray scattering radiography. A single crystal of iron-3%(wt)silicon alloy was examined to demonstrate the capability of the system. An accuracy of 20 arc seconds has been attained by the present apparatus with a spatial resolution of less than 48 µm. © 1990 IOP Publishing Ltd.

引用

页码：L378 / L380

页数：3

共 6 条

[1]

Chikaur Y., 1985, Oyo Buturi, V54, P159

[2]

Chikaura Y., 1986, Oyo Buturi, V55, P983

[3]

Chikaura Y., 1985, Oyo Buturi, V54, P1101

[4] POLYCRYSTAL SCATTERING TOPOGRAPHY [J].

CHIKAURA, Y ;

YONEDA, Y ;

HILDEBRANDT, G .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (FEB) :48-54

[5]

WASSERMANN G, 1962, TEXTUREN METALLISCHE, P400

[6] POLYCRYSTAL SCATTERING TOPOGRAPHY, SCATTERING TOMOGRAPHY AND THEIR PERSPECTIVE FIELDS OF APPLICATION [J].

YONEDA, Y ;

CHIKAURA, Y .

ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1982, 37 (05) :412-418

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