MAGNETOOPTICAL FARADAY-EFFECT PROBED IN A SCANNING TUNNELING MICROSCOPE

被引：7

作者：

PRINS, MWJ ^{[1
]}

VANDERWIELEN, MCMM ^{[1
]}

ABRAHAM, DL ^{[1
]}

VANKEMPEN, H ^{[1
]}

VANKESTEREN, HW ^{[1
]}

机构：

[1] PHILIPS RES LABS,5656 AA EINDHOVEN,NETHERLANDS

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1994年 / 30卷 / 06期

关键词：

SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING TIPS; FARADAY ELLIPTICITY; MAGNETOOPTICAL IMAGING;

D O I：

10.1109/20.334117

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Semiconductor tips are used as local photodetectors in a scanning tunneling microscope. We demonstrate that this configuration is sensitive to small light intensity variations, as supported by a simple model. The principle is applied to the detection of Faraday ellipticity of a Pt/Co multilayer sample. The outlook of this new technique in magneto-optical imaging is briefly discussed.

引用

页码：4491 / 4493

页数：3

共 6 条

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