THE FABRICATION OF METAL-OXIDE SEMICONDUCTOR TRANSISTORS USING CERIUM DIOXIDE AS A GATE OXIDE MATERIAL

被引:29
作者
FRANGOUL, AG
SUNDARAM, KB
WAHID, PF
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1991年 / 9卷 / 01期
关键词
D O I
10.1116/1.585285
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Cerium dioxide was employed as a gate insulator for an enhancement-type n-channel metal-oxide-semiconductor (MOS) transistor. Cerium was evaporated in a tungsten boat and immediately oxidized for oxide uniformity. The use of CeO2 as a gate oxide in MOS transistor yielded a low positive threshold voltage with negligible interface charge effects. This resulted in the transistor performing as an enhancement type device.
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页码:181 / 183
页数:3
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