MAGNETIC DOMAIN-STRUCTURES OF RAPIDLY QUENCHED FE-CU-NB-SI-B ALLOYS OBSERVED BY LORENTZ MICROSCOPY

被引:23
作者
KOHMOTO, O
UCHIDA, N
AOYAGI, E
CHOH, T
HIRAGA, K
机构
[1] TOHOKU UNIV,HIGH VOLTAGE ELECTRON MICROSCOPY LAB,SENDAI,MIYAGI 980,JAPAN
[2] TOHOKU UNIV,INST MAT RES,SENDAI,MIYAGI 980,JAPAN
来源
MATERIALS TRANSACTIONS JIM | 1990年 / 31卷 / 09期
关键词
annealing; domain wall; high permeability; iron-based alloy; Lorentz microscopy; magnetic domain; melt quenching; microcrystalline;
D O I
10.2320/matertrans1989.31.820
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Magnetic domain structures of finely crystallized Fe73.5Cu1Nb3Si13.5B9 alloys have been studied by Lorentz microscopy. We found the size of the uniform area (du) having a locally uniform anisotropy strongly affects the domain structure and the associated magnetic properties. In the highest-permeability alloy annealed at 550°C, circularly magnetized domain patterns were observed. Since the domain-wall width (wd) is about five times as large as the area having a magnetic uniform anisotropy for the highest-permeability alloy (wd ∽ 5du), effects of the anisotropy field are averaged to zero, resulting in free movement of the domain wall. © 1990, The Japan Institute of Metals. All rights reserved.
引用
收藏
页码:820 / 823
页数:4
相关论文
共 15 条
[11]   MEASUREMENT OF SATURATION MAGNETOSTRICTION OF A THIN AMORPHOUS RIBBON BY MEANS OF SMALL-ANGLE MAGNETIZATION ROTATION [J].
NARITA, K ;
YAMASAKI, J ;
FUKUNAGA, H .
IEEE TRANSACTIONS ON MAGNETICS, 1980, 16 (02) :435-439
[12]   ELECTRON-MICROSCOPY OF CO-FE-B-SI AMORPHOUS-ALLOYS [J].
RABENBERG, L ;
MISHRA, RK ;
THOMAS, G ;
KOHMOTO, O ;
OJIMA, T .
IEEE TRANSACTIONS ON MAGNETICS, 1980, 16 (05) :1135-1137
[13]   LORENTZ ELECTRON-MICROSCOPE OBSERVATION OF DOMAIN-WALLS IN FE-ND-B ALLOY PERMANENT-MAGNETS [J].
SUZUKI, T ;
HIRAGA, K ;
SAGAWA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1984, 23 (06) :L421-L423
[15]   FE BASED SOFT MAGNETIC-ALLOYS COMPOSED OF ULTRAFINE GRAIN-STRUCTURE [J].
YOSHIZAWA, Y ;
YAMAUCHI, K .
JOURNAL OF THE JAPAN INSTITUTE OF METALS, 1989, 53 (02) :241-248