CALIBRATION OF AN OPTICAL COMPENSATOR BY ELLIPSOMETRY

[1] DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (09) : 970 - &

[2] THE CALIBRATION OF QUARTER-WAVE PLATES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1952, 42 (03) : 159 - 165

[3] MCCRACKIN FL, 1963, J RES NATL BUR STD U, VA 67, P363

[4] PASSAGLIA E, 1964, 256 NATL BUR STD US

[5] WINTERBOTTOM AB, 1955, 1 ROYAL NORW SCI SOC

[1] DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (09) : 970 - &

[2] THE CALIBRATION OF QUARTER-WAVE PLATES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1952, 42 (03) : 159 - 165

[3] MCCRACKIN FL, 1963, J RES NATL BUR STD U, VA 67, P363

[4] PASSAGLIA E, 1964, 256 NATL BUR STD US

[5] WINTERBOTTOM AB, 1955, 1 ROYAL NORW SCI SOC