REFLECTION EXTENDED X-RAY ABSORPTION FINE-STRUCTURE RECORDED USING A LASER-PRODUCED PLASMA X-RAY SOURCE

被引：10

作者：

EASON, RW

BRADLEY, DK

DOBSON, PJ

HARES, JD

机构：

[1] RUTHERFORD APPLETON LAB,DIV LASER,DIDCOT OX11 0QX,OXON,ENGLAND

[2] UNIV LONDON IMPERIAL COLL SCI & TECHNOL,DEPT PHYS,LONDON SW7 2BZ,ENGLAND

来源：

关键词：

D O I：

10.1063/1.96140

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：442 / 444

页数：3

共 15 条

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[13] A FAST X-RAY ABSORPTION SPECTROMETER FOR USE WITH SYNCHROTRON RADIATION
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PHIZACKERLEY, RP
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (11) : 2223 - 2228
[14] NAGAKURA I, 1964, SCI REP TOHOKU U, V48, P37
[15] SURFACE STUDIES OF SOLIDS BY TOTAL REFLECTION OF X-RAYS
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[J]. PHYSICAL REVIEW, 1954, 95 (02): : 359 - 369