CHARACTERIZATION OF MULTILAYER X-RAY ANALYZERS - MODELS AND MEASUREMENTS

被引:36
作者
HENKE, BL
UEJIO, JY
YAMADA, HT
TACKABERRY, RE
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D O I
10.1117/12.7973933
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
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页码:937 / 947
页数:11
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