CHARACTERIZATION OF MULTILAYER X-RAY ANALYZERS - MODELS AND MEASUREMENTS

被引：36

作者：

HENKE, BL

UEJIO, JY

YAMADA, HT

TACKABERRY, RE

机构：

来源：

关键词：

D O I：

10.1117/12.7973933

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：937 / 947

页数：11

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