MOSSBAUER DEPTH PROFILING TECHNIQUE FOR OXIDATION STUDIES

被引：6

作者：

BAYREUTHER, G

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1983年 / 1卷 / 01期

关键词：

D O I：

10.1116/1.572302

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：19 / 22

页数：4

共 17 条

[1] DEPTH SELECTIVE MOSSBAUER-EFFECT MEASUREMENTS BY MEANS OF SCATTERED ELECTRONS
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[2] ELECTROSTATIC SPECTROMETER FOR CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY
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BOHM, C
EKDAHL, T
LILJEQUIST, D
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 154 (02): : 401 - 403
[3] SEARCH FOR ELECTRIC-CHARGE-INDUCED MAGNETIZATION IN FERROMAGNETIC THIN-FILMS
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HOFFMAN, H
REFFLE, J
[J]. PHYSICAL REVIEW B, 1979, 19 (03): : 1614 - 1622
[4] BAYREUTHER G, 1976, THESIS U REGENSBURG
[5] X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF CHEMICAL CHANGES IN OXIDE AND HYDROXIDE SURFACES INDUCED BY AR+ ION-BOMBARDMENT
CHUANG, TJ
BRUNDLE, CR
WANDELT, K
[J]. THIN SOLID FILMS, 1978, 53 (01) : 19 - 27
[6] AN UHV-SPECTROMETER FOR CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY
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KYVELOS, B
KAINDL, G
[J]. HYPERFINE INTERACTIONS, 1981, 10 (1-4): : 1137 - 1141
[7] ANALYSIS OF IRON CORROSION PRODUCTS USING MOSSBAUER-SPECTROSCOPY
GRAHAM, MJ
COHEN, M
[J]. CORROSION, 1976, 32 (11) : 432 - 438
[8] UNTERSUCHUNG VON KONVERSIONSELEKTRONEN BEIM MOSSBAUER-EFFEKT AM WOLFRAM-182 MIT EINEM MAGNETISCHEN SPEKTROMETER
KANKELEIT, E
[J]. ZEITSCHRIFT FUR PHYSIK, 1961, 164 (04): : 442 - &
[9] ANALYSIS OF ELECTRON-TRANSPORT IN CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY (CEMS)
LILJEQUIST, D
EKDAHL, T
BAVERSTAM, U
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 155 (03): : 529 - 538
[10] INTERPRETATION AND PRACTICAL ANALYSIS OF DEPTH SELECTIVE CONVERSION ELECTRON MOSSBAUER-SPECTRA
LILJEQUIST, D
BODLUNDRINGSTROM, B
[J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 160 (01): : 131 - 136

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