THE TEMPERATURE-DEPENDENCE OF THRESHOLD VOLTAGES IN SUBMICROMETER CMOS

被引:18
作者
TZOU, JJ
YAO, CC
CHEUNG, R
CHAN, H
机构
关键词
D O I
10.1109/EDL.1985.26114
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:250 / 252
页数:3
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