QUALITY ASSURANCE OF FLUORESCENCE PEAK INTENSITIES IN EDXRF ANALYSIS OF ENVIRONMENTAL-SAMPLES

被引：5

作者：

CHRISTENSEN, LH ^{[1
]}

HEYDORN, K ^{[1
]}

机构：

[1] RISO NATL LAB,DK-4000 ROSKILDE,DENMARK

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1990年 / 299卷 / 1-3期

关键词：

D O I：

10.1016/0168-9002(90)90844-V

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A quality assurance methodology based on the Analysis of Precision was applied to results obtained by EDXRF. It was found that statistical control could be achieved in the processing of X-ray spectra with the program MicroSAMPO and an optimized Covell program, but not with a conventional Gaussian fitting program. Final results were consistent with an a priori precision of approximately 1% from the sample preparation stage, and no significant uncertainty could be attributed to the backscatter/fundamental parameter approach to the quantification. The method under investigation was found suitable for the analysis of environmental samples from chromium-contaminated grounds.

引用

页码：562 / 566

页数：5

共 8 条

[1] MICROSAMPO - PERSONAL-COMPUTER BASED ADVANCED GAMMA-SPECTRUM ANALYSIS SYSTEM [J].