ERROR ANALYSIS IN SEMICONDUCTOR IMPURITY ENERGY-LEVEL DETERMINATIONS

被引：2

作者：

NEVIN, JH

HENDERSON, HT

SHEN, KL

机构：

来源：

关键词：

D O I：

10.1016/0025-5408(82)90058-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1111 / 1120

页数：10

共 14 条

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