A PRECISION BOND METHOD WITH SR

被引：8

作者：

ANDO, M

HAGASHI, Y

USUDA, K

YASUAMI, S

KAWATA, H

机构：

[1] KEK NAT LAB HIGH ENERGY PHYS,APPL SCI,TSUKUBA,IBARAKI 305,JAPAN

[2] TOSHIBA CO LTD,CTR RES & DEV,KAWASAKI 210,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 07期

关键词：

D O I：

10.1063/1.1140732

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：2410 / 2413

页数：4

共 9 条

[1]

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[2]

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[3]

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HART, M .

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[6] X-RAY CRYSTAL COLLIMATORS USING SUCCESSIVE ASSYMMETRIC DIFFRACTIONS AND THEIR APPLICATIONS TO MEASUREMENTS OF DIFFRACTION CURVES .1. GENERAL CONSIDERATIONS ON COLLIMATORS [J].

KIKUTA, S ;

KOHRA, K .

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[7] IMPROVEMENT OF HIGH-ANGLE DOUBLE-CRYSTAL X-RAY-DIFFRACTOMETRY (HADOX) FOR MEASURING TEMPERATURE-DEPENDENCE OF LATTICE-CONSTANTS .2. PRACTICE [J].

OHAMA, N ;

SAKASHITA, H ;

OKAZAKI, A .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (OCT) :455-459

[8]

TANAKO Y, 1973, SEMICONDUCTOR SILICO, P469

[9]

USUDA K, UNPUB

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