DIRECT VISUALIZATION OF ELECTROMAGNETIC MICROFIELDS BY INTERFERENCE OF 3 ELECTRON WAVES

被引：12

作者：

HIRAYAMA, T ^{[1
]}

TANJI, T ^{[1
]}

TONOMURA, A ^{[1
]}

机构：

[1] HITACHI LTD,ADV RES LAB,HATOYAMA,SAITAMA 35003,JAPAN

来源：

APPLIED PHYSICS LETTERS | 1995年 / 67卷 / 09期

关键词：

D O I：

10.1063/1.115001

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A method is presented for direct visualization of electromagnetic microfields. Using a transmission electron microscope equipped with a field-emission electron gun and two electron biprisms, an object wave and two reference waves are superposed to interfere for producing a new type of interference pattern in which electromagnetic fields are directly observed. Equal-potential lines of an electric field around a latex particle and magnetic flux lines emerging from a barium ferrite particle have been observed. (C) 1995 American Institute of Physics.

引用

页码：1185 / 1187

页数：3

共 17 条

[1] VIDEO-RATE ELECTRON-HOLOGRAPHIC INTERFERENCE MICROSCOPY AND ITS APPLICATION TO DYNAMIC OBSERVATION OF ELECTROMAGNETIC-FIELDS [J].