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[2]
THICKNESS OF NATURAL OXIDE-FILMS DETERMINED BY AES AND XPS WITH WITHOUT SPUTTERING
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1985, 3 (02)
:331-335
[5]
[No title captured]
[6]
[No title captured]
[7]
[No title captured]