THICKNESS OF NATURAL OXIDE-FILMS DETERMINED BY AES AND XPS WITH WITHOUT SPUTTERING

被引:101
作者
MATHIEU, HJ
DATTA, M
LANDOLT, D
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1985年 / 3卷 / 02期
关键词
D O I
10.1116/1.573260
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
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页码:331 / 335
页数:5
相关论文
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