EIN BIPRISMA-INTERFEROMETER FUR ELEKTRONENWELLEN UND SEINE ANWENDUNG

[1] THE MEASUREMENT OF THE THICKNESS OF THIN CARBON FILMS [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1957, 8 (01): : 35 - 36

[2] Bethe H, 1928, ANN PHYS-BERLIN, V87, P55

[3] EVAPORATED CARBON FILMS FOR USE IN ELECTRON MICROSCOPY [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1954, 5 (FEB): : 65 - 69

[4] BRICKA M, 1948, ANN RADIOELECTR, V3, P339

[5] BUEHL A, 1932, PHYS Z, V33, P812

[6] INTERFERENZMIKROSKOPIE MIT ELEKTRONENWELLEN [J]. ZEITSCHRIFT FUR PHYSIK, 1959, 155 (04): : 395 - 412

[7] BUHL R, 1958, 4 IKEM, P233

[8] DUEKER H, 1955, Z NATURFORSCH, V10A, P256

[9] FAGET J, 1957, CR HEBD ACAD SCI, V244, P2368

[10] FAGET J, 1957, CAH PHYS, V83, P285

[1] THE MEASUREMENT OF THE THICKNESS OF THIN CARBON FILMS [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1957, 8 (01): : 35 - 36

[2] Bethe H, 1928, ANN PHYS-BERLIN, V87, P55

[3] EVAPORATED CARBON FILMS FOR USE IN ELECTRON MICROSCOPY [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1954, 5 (FEB): : 65 - 69

[4] BRICKA M, 1948, ANN RADIOELECTR, V3, P339

[5] BUEHL A, 1932, PHYS Z, V33, P812

[6] INTERFERENZMIKROSKOPIE MIT ELEKTRONENWELLEN [J]. ZEITSCHRIFT FUR PHYSIK, 1959, 155 (04): : 395 - 412

[7] BUHL R, 1958, 4 IKEM, P233

[8] DUEKER H, 1955, Z NATURFORSCH, V10A, P256

[9] FAGET J, 1957, CR HEBD ACAD SCI, V244, P2368

[10] FAGET J, 1957, CAH PHYS, V83, P285