INVERSE PHOTOEMISSION

被引：38

作者：

WOODRUFF, DP ^{[1
]}

JOHNSON, PD ^{[1
]}

SMITH, NV ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1983年 / 1卷 / 02期

关键词：

D O I：

10.1116/1.572344

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1104 / 1110

页数：7

共 34 条

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ZUTAVERN, F .

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[2]

CARDONA M, 1979, PHOTOEMISSION SOLIDS, V2

[3]

CARDONA M, 1979, PHOTOEMISSION SOLIDS, V1

[4] INVERSE PHOTOEMISSION SPECTROMETER IN THE RANGE 20-100 EV [J].

CHAUVET, G ;

BAPTIST, R .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1981, 24 (03) :255-265

[5] ISOCHROMAT SPECTROSCOPY USING SXAPS EQUIPMENT [J].

CONRAD, M ;

DOSE, V ;

FAUSTER, T ;

SCHEIDT, H .

APPLIED PHYSICS, 1979, 20 (01) :37-40

[6] EVIDENCE FOR DIRECT OPTICAL INTERBAND-TRANSITIONS IN ISOCHROMAT SPECTRA FROM PT SINGLE-CRYSTAL SURFACES [J].

DENNINGER, G ;

DOSE, V ;

BONZEL, HP .

PHYSICAL REVIEW LETTERS, 1982, 48 (04) :279-282

[7] VUV ISOCHROMAT SPECTROMETER FOR SURFACE-ANALYSIS [J].

DENNINGER, G ;

DOSE, V ;

SCHEIDT, H .

APPLIED PHYSICS, 1979, 18 (04) :375-380

[8] INVESTIGATION OF INTRINSIC UNOCCUPIED SURFACE-STATES AT GAAS(110) BY ISOCHROMAT SPECTROSCOPY [J].

DOSE, V ;

GOSSMANN, HJ ;

STRAUB, D .

PHYSICAL REVIEW LETTERS, 1981, 47 (08) :608-610

[9] VUV ISOCHROMAT SPECTROSCOPY [J].

DOSE, V .

APPLIED PHYSICS, 1977, 14 (01) :117-118

[10] INVERSE PHOTOEMISSION FROM NI(100) AND NI(111) WITH ORIENTED OXYGEN OVERLAYERS [J].

DOSE, V ;

GLOBL, M ;

SCHEIDT, H .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02) :1115-1118

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