CHARACTERIZATION OF NANOMETER-SCALE EPITAXIAL STRUCTURES BY GRAZING-INCIDENCE X-RAY-DIFFRACTION AND SPECULAR REFLECTIVITY

被引：55

作者：

LUCAS, CA ^{[1
]}

HATTON, PD ^{[1
]}

BATES, S ^{[1
]}

RYAN, TW ^{[1
]}

MILES, S ^{[1
]}

TANNER, BK ^{[1
]}

机构：

[1] UNIV DURHAM,DEPT PHYS,DURHAM DH1 3LE,ENGLAND

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 63卷 / 06期

关键词：

D O I：

10.1063/1.339895

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1936 / 1941

页数：6

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