NEW APPROACH TO SEMICONDUCTOR DETECTOR EFFICIENCY CALIBRATION

被引:11
作者
ABREU, MC [1 ]
MAIO, AA [1 ]
TEMESDOLIVEIRA, MJ [1 ]
机构
[1] UNIV LISBON,LAB PHYS,LISBON,PORTUGAL
来源
NUCLEAR INSTRUMENTS & METHODS | 1975年 / 123卷 / 02期
关键词
D O I
10.1016/0029-554X(75)90011-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:295 / 300
页数:6
相关论文
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