ELLIPSOMETRIC INSITU STUDIES OF THE GROWTH OF ZNS FILM

[1] THE INFLUENCE OF DEPOSITION PARAMETERS ON THE OPTICAL-PROPERTIES AND GROWTH OF ZNS FILMS [J]. THIN SOLID FILMS, 1983, 100 (04) : 273 - 281

[2] GOLDFINGER P, 1959, ADV MASS SPECTROM, V1, P534

[3] DIELECTRIC ANOMALY IN ZNS FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (10) : 3042 - &

[4] DIELECTRIC THIN FILMS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (06) : 469 - 472

[5] REFRACTIVE INDEX OF INHOMOGENEOUS FILMS [J]. PHILOSOPHICAL MAGAZINE, 1970, 21 (174): : 1229 - &

[6] OLIVER WR, 1970, OPT ACTA, V17, P593, DOI 10.1080/713818339

[7] PREISINGER A, 1974, JPN J APPL PHYS S, V2, P769

[8] AN INVESTIGATION OF EVAPORATION PROCESS OF DIELECTRIC MATERIALS [J]. THIN SOLID FILMS, 1969, 4 (03) : 219 - &

[9] INFLUENCE OF SUBSTRATE TEMPERATURE ON CONDENSATION OF VACUUM EVAPORATED FILMS OF MGF2 AND ZNS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 733 - &

[10] RITTER E, 1975, PHYS THIN FILMS, V8, P1

[1] THE INFLUENCE OF DEPOSITION PARAMETERS ON THE OPTICAL-PROPERTIES AND GROWTH OF ZNS FILMS [J]. THIN SOLID FILMS, 1983, 100 (04) : 273 - 281

[2] GOLDFINGER P, 1959, ADV MASS SPECTROM, V1, P534

[3] DIELECTRIC ANOMALY IN ZNS FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (10) : 3042 - &

[4] DIELECTRIC THIN FILMS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (06) : 469 - 472

[5] REFRACTIVE INDEX OF INHOMOGENEOUS FILMS [J]. PHILOSOPHICAL MAGAZINE, 1970, 21 (174): : 1229 - &

[6] OLIVER WR, 1970, OPT ACTA, V17, P593, DOI 10.1080/713818339

[7] PREISINGER A, 1974, JPN J APPL PHYS S, V2, P769

[8] AN INVESTIGATION OF EVAPORATION PROCESS OF DIELECTRIC MATERIALS [J]. THIN SOLID FILMS, 1969, 4 (03) : 219 - &

[9] INFLUENCE OF SUBSTRATE TEMPERATURE ON CONDENSATION OF VACUUM EVAPORATED FILMS OF MGF2 AND ZNS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 733 - &

[10] RITTER E, 1975, PHYS THIN FILMS, V8, P1