LOW-FREQUENCY RESISTANCE FLUCTUATION MEASUREMENTS ON CONDUCTING POLYMER THIN-FILM RESISTORS

被引：14

作者：

BRUSCHI, P

CACIALLI, F

NANNINI, A

NERI, B

机构：

[1] Dipto. di Ingegneria della Informazione, Elettron., Info., Telecomunicazioni, Univ. degli Studi di Pisa, I-56126 Pisa

来源：

JOURNAL OF APPLIED PHYSICS | 1994年 / 76卷 / 06期

关键词：

D O I：

10.1063/1.357427

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Low-frequency resistance fluctuations were measured on-polypyrrole thin-film resistors. The samples were obtained by chemical-vapor deposition onto copper chloride patterned precursors. The measurements were devoted to characterize the noise spectral density of constant-current-biased samples. The dependence of the noise magnitude on the applied de voltage was studied revealing that the noise cannot be ascribed only to equilibrium resistance fluctuations. Application of the Hooge formula provided an estimate of carrier density in the material.

引用

页码：3640 / 3644

页数：5

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