ENGINEERED AL - GAAS SCHOTTKY-BARRIER HEIGHTS BY MBE

被引:3
作者
EGLASH, SJ
PAN, S
SPICER, WE
COLLINS, DM
机构
[1] STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305
[2] HEWLETT PACKARD CO,SOLID STATE LAB,PALO ALTO,CA 94304
关键词
D O I
10.1109/T-ED.1982.20981
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1690 / 1691
页数:2
相关论文
共 2 条
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SHANNON, JM .
SOLID-STATE ELECTRONICS, 1976, 19 (06) :537-543
[2]   UNIFIED DEFECT MODEL AND BEYOND [J].
SPICER, WE ;
LINDAU, I ;
SKEATH, P ;
SU, CY .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05) :1019-1027