A HIGH-SPEED LSI GAAS 8BY8-BIT PARALLEL MULTIPLIER

[1] BARNARD J, 1979, TECH DIG DEC, P281

[2] BOCCONGIBOD D, 1980, NOV GAAS IC S LAS VE

[3] 1 MU-M MOSFET VLSI TECHNOLOGY .2. DEVICE DESIGNS AND CHARACTERISTICS FOR HIGH-PERFORMANCE LOGIC APPLICATIONS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (02) : 247 - 255

[4] PROSPECTS FOR ULTRAHIGH-SPEED VLSI GAAS DIGITAL LOGIC [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (02) : 221 - 239

[5] EDEN RC, 1977, 1978 INT SOL STAT CI, P68

[6] RELIABILITY STUDY OF GAAS MESFETS [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1976, 24 (06) : 321 - 328

[7] LONG SI, 1979, TECH DIG APR, P509

[8] DEGRADATION MECHANISM OF GAAS-MESFETS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (07) : 1008 - 1014

[9] GAAS GIGABIT LOGIC-CIRCUITS USING NORMALLY-OFF MESFETS [J]. ELECTRONICS LETTERS, 1980, 16 (09) : 315 - 316

[10] ROOSILD SA, F1962870C0094 AIR FO

[1] BARNARD J, 1979, TECH DIG DEC, P281

[2] BOCCONGIBOD D, 1980, NOV GAAS IC S LAS VE

[3] 1 MU-M MOSFET VLSI TECHNOLOGY .2. DEVICE DESIGNS AND CHARACTERISTICS FOR HIGH-PERFORMANCE LOGIC APPLICATIONS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (02) : 247 - 255

[4] PROSPECTS FOR ULTRAHIGH-SPEED VLSI GAAS DIGITAL LOGIC [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (02) : 221 - 239

[5] EDEN RC, 1977, 1978 INT SOL STAT CI, P68

[6] RELIABILITY STUDY OF GAAS MESFETS [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1976, 24 (06) : 321 - 328

[7] LONG SI, 1979, TECH DIG APR, P509

[8] DEGRADATION MECHANISM OF GAAS-MESFETS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (07) : 1008 - 1014

[9] GAAS GIGABIT LOGIC-CIRCUITS USING NORMALLY-OFF MESFETS [J]. ELECTRONICS LETTERS, 1980, 16 (09) : 315 - 316

[10] ROOSILD SA, F1962870C0094 AIR FO