REAL-TIME DATA ACQUISITION FOR GAS ELECTRON-DIFFRACTION

被引：29

作者：

EWBANK, JD

SCHAFER, L

PAUL, DW

BENSTON, OJ

LENNOX, JC

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1984年 / 55卷 / 10期

关键词：

D O I：

10.1063/1.1137624

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1598 / 1603

页数：6

共 15 条

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APPLIED SPECTROSCOPY, 1984, 38 (02) :204-208

[3] PROCESSOR-CONTROLLED MICRODENSITOMETRY [J].

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BOWERS, P ;

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APPLIED SPECTROSCOPY, 1981, 35 (06) :540-543

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[5]

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[7] SMALL-ANGLE ELECTRON-DIFFRACTION BY GASES - APPARATUS WITH ELECTRON-COUNTING DEVICE [J].

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JAPANESE JOURNAL OF APPLIED PHYSICS, 1972, 11 (08) :1199-&

[8] PROCESSOR CONTROLLED MULTICHANNEL MICRODENSITOMETRY FOR GAS ELECTRON-DIFFRACTION PATTERNS [J].

PAUL, DW ;

EWBANK, JD ;

BENSTON, OJ ;

SCHAFER, L .

APPLIED SPECTROSCOPY, 1983, 37 (02) :127-130

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