READOUT PROPERTIES OF THE SPECKLEGRAM RECORDED IN PHOTOREFRACTIVE BI12SIO20 CRYSTAL

被引：18

作者：

NAKAGAWA, K

MINEMOTO, T

机构：

[1] Kobe University, Department of Instrumentation Engineering, Rokkodai, Nada-ku, Kobe

来源：

APPLIED OPTICS | 1991年 / 30卷 / 17期

关键词：

SPECKLE PHOTOGRAPHY; PHOTOREFRACTIVE MATERIAL; BSO CRYSTAL;

D O I：

10.1364/AO.30.002386

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The readout properties of the specklegram recorded in a photorefractive Bi12SiO20 (BSO) crystal plate have been investigated by observing the Young fringes and the polarization change of the light transmitted from the BSO plate. The Young fringes can be obtained without an analyzer by any linearly polarized readout beam; they have higher visibility than those obtained from a photographic plate specklegram, since the specklegram recorded in the BSO crystal can be read out by the spatial distribution of both the degree of polarization and the azimuth angle of polarization. Selective interference of a kind is performed.

引用

页码：2386 / 2392

页数：7

共 7 条

[1] PHOTOACTIVITY AND FIELD INDUCED CHANGES IN OPTICAL ROTATION IN BISMUTH SILICON OXIDE (BI12SIO20) [J].

MOORE, GF ;

LENZO, PV ;

SPENCER, EG ;

BALLMAN, AA .

JOURNAL OF APPLIED PHYSICS, 1969, 40 (05) :2361-&

[2] MEASUREMENT OF THE ELECTROGYRATORY COEFFICIENT IN PHOTOREFRACTIVE BI12SIO20 CRYSTAL [J].

NAKAGAWA, K ;

KAJITA, N ;

CHEN, J ;

MINEMOTO, T .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :954-958

[3] MEASUREMENT OF THE DISPLACEMENT DISTRIBUTION BY SPECKLE PHOTOGRAPHY USING A BSO CRYSTAL [J].

NAKAGAWA, K ;

TAKATSUJI, T ;

MINEMOTO, T .

OPTICS COMMUNICATIONS, 1990, 76 (3-4) :206-212

[4]

NYE JF, 1960, PHYSICAL PROPERTIES, P260

[5] REAL-TIME DISPLACEMENT AND TILT ANALYSIS BY A SPECKLE TECHNIQUE USING BI12SIO20-CRYSTALS [J].

TIZIANI, HJ ;

LEONHARDT, K ;

KLENK, J .

OPTICS COMMUNICATIONS, 1980, 34 (03) :327-331

[6] MEASUREMENT OF THE ELECTROGYRATORY AND ELECTROOPTIC EFFECTS IN BSO ANG BGO [J].

VACHSS, F ;

HESSELINK, L .

OPTICS COMMUNICATIONS, 1987, 62 (03) :159-165

[7] OPTIMAL PROPERTIES OF PHOTOREFRACTIVE MATERIALS FOR OPTICAL-DATA PROCESSING [J].

VALLEY, GC ;

KLEIN, MB .

OPTICAL ENGINEERING, 1983, 22 (06) :704-711

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