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CHARGE-INJECTION IMAGING - OPERATING TECHNIQUES AND PERFORMANCES CHARACTERISTICS
被引:18
作者
:
BURKE, HK
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
BURKE, HK
[
1
]
MICHON, GJ
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
MICHON, GJ
[
1
]
机构
:
[1]
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
来源
:
IEEE JOURNAL OF SOLID-STATE CIRCUITS
|
1976年
/ 11卷
/ 01期
关键词
:
D O I
:
10.1109/JSSC.1976.1050686
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:121 / 128
页数:8
相关论文
共 11 条
[1]
VIDEO SIGNALS AND SWITCHING TRANSIENTS IN CAPACITOR-PHOTODIODE AND CAPACITOR-PHOTOTRANSISTOR IMAGE SENSORS
ARNOLD, E
论文数:
0
引用数:
0
h-index:
0
ARNOLD, E
CROWELL, MH
论文数:
0
引用数:
0
h-index:
0
CROWELL, MH
GEYER, RD
论文数:
0
引用数:
0
h-index:
0
GEYER, RD
MATHUR, DP
论文数:
0
引用数:
0
h-index:
0
MATHUR, DP
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1971,
ED18
(11)
: 1003
-
&
[2]
TRANSPARENT METAL-OXIDE ELECTRODE CID IMAGER
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
BROWN, DM
GHEZZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GHEZZO, M
GARFINKEL, M
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GARFINKEL, M
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1976,
11
(01)
: 128
-
132
[3]
CARNES JE, 1972, RCA REV, V33, P327
[4]
LOW FREQUENCY NOISE IN MOS TRANSISTORS .I. THEORY
CHRISTEN.S
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
CHRISTEN.S
LUNDSTRO.I
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
LUNDSTRO.I
SVENSSON, C
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
SVENSSON, C
[J].
SOLID-STATE ELECTRONICS,
1968,
11
(09)
: 797
-
&
[5]
SURFACE RECOMBINATION IN SEMICONDUCTORS
FITZGERALD, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, CA
FITZGERALD, DJ
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, CA
GROVE, AS
[J].
SURFACE SCIENCE,
1968,
9
(02)
: 347
-
+
[6]
Grove A S, 1967, PHYS TECHNOLOGY SEMI
[7]
MICHON GJ, 1975, P S CHARGE COUPLED D, P106
[8]
MICHON GJ, 1973, INT SOLID STATE CIRC, P138
[9]
MICHON GJ, 1974, ISSCC DIG TECH PAPER, P26
[10]
NOISE MEASUREMENTS IN CHARGE-COUPLED-DEVICES
MOHSEN, AM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
MOHSEN, AM
TOMPSETT, MF
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
TOMPSETT, MF
SEQUIN, CH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
SEQUIN, CH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(05)
: 209
-
218
←
1
2
→
共 11 条
[1]
VIDEO SIGNALS AND SWITCHING TRANSIENTS IN CAPACITOR-PHOTODIODE AND CAPACITOR-PHOTOTRANSISTOR IMAGE SENSORS
ARNOLD, E
论文数:
0
引用数:
0
h-index:
0
ARNOLD, E
CROWELL, MH
论文数:
0
引用数:
0
h-index:
0
CROWELL, MH
GEYER, RD
论文数:
0
引用数:
0
h-index:
0
GEYER, RD
MATHUR, DP
论文数:
0
引用数:
0
h-index:
0
MATHUR, DP
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1971,
ED18
(11)
: 1003
-
&
[2]
TRANSPARENT METAL-OXIDE ELECTRODE CID IMAGER
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
BROWN, DM
GHEZZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GHEZZO, M
GARFINKEL, M
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GE,CORPORATE RES & DEV CTR,SCHENECTADY,NY 12301
GARFINKEL, M
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1976,
11
(01)
: 128
-
132
[3]
CARNES JE, 1972, RCA REV, V33, P327
[4]
LOW FREQUENCY NOISE IN MOS TRANSISTORS .I. THEORY
CHRISTEN.S
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
CHRISTEN.S
LUNDSTRO.I
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
LUNDSTRO.I
SVENSSON, C
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
SVENSSON, C
[J].
SOLID-STATE ELECTRONICS,
1968,
11
(09)
: 797
-
&
[5]
SURFACE RECOMBINATION IN SEMICONDUCTORS
FITZGERALD, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, CA
FITZGERALD, DJ
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, CA
GROVE, AS
[J].
SURFACE SCIENCE,
1968,
9
(02)
: 347
-
+
[6]
Grove A S, 1967, PHYS TECHNOLOGY SEMI
[7]
MICHON GJ, 1975, P S CHARGE COUPLED D, P106
[8]
MICHON GJ, 1973, INT SOLID STATE CIRC, P138
[9]
MICHON GJ, 1974, ISSCC DIG TECH PAPER, P26
[10]
NOISE MEASUREMENTS IN CHARGE-COUPLED-DEVICES
MOHSEN, AM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
MOHSEN, AM
TOMPSETT, MF
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
TOMPSETT, MF
SEQUIN, CH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
SEQUIN, CH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(05)
: 209
-
218
←
1
2
→