NOISE MEASUREMENTS IN CHARGE-COUPLED-DEVICES

被引：23

作者：

MOHSEN, AM ^{[1
]}

TOMPSETT, MF ^{[1
]}

SEQUIN, CH ^{[1
]}

机构：

[1] BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974

来源：

关键词：

D O I：

10.1109/T-ED.1975.18110

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：209 / 218

页数：10

共 23 条

[1] 3-LEVEL METALLIZATION 3-PHASE CCD
BERTRAM, WJ
MOHSEN, AM
MORRIS, FJ
SEALER, DA
SEQUIN, CH
TOMPSETT, MF
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (12) : 758 - 767
[2] BOONSTRA L, 1972, 1972 IEEE INT SOL ST, P140
[3] CHARGE COUPLED SEMICONDUCTOR DEVICES
BOYLE, WS
SMITH, GE
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04): : 587 - +
[4] CARNES JE, 1972, RCA REV, V33, P327
[5] CARNES JE, 1973, RCA REV, V34, P553
[6] EMMONS SP, 1973, JUN DEV RES C BOULD
[7] EMMONS SP, TO BE PUBLISHED
[8] KIM CK, 1972, C P NEREM, P161
[9] Mohsen A. M., 1974, IEEE Transactions on Electron Devices, VED-21, P701, DOI 10.1109/T-ED.1974.17997
[10] PUSH CLOCKS - NEW APPROACH TO CHARGE-COUPLED DEVICES CLOCKING
MOHSEN, AM
MCGILL, TC
ANTHONY, M
MEAD, CA
[J]. APPLIED PHYSICS LETTERS, 1973, 22 (04) : 172 - 175