FEMTOSECOND TIME-RESOLVED REFLECTOMETRY MEASUREMENTS OF MULTIPLE-LAYER DIELECTRIC MIRRORS

被引:27
作者
WEINER, AM
FUJIMOTO, JG
IPPEN, EP
机构
[1] MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
[2] MIT,ELECTR RES LAB,CAMBRIDGE,MA 02139
关键词
D O I
10.1364/OL.10.000071
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:71 / 73
页数:3
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