STATISTICAL CHARACTERISTICS OF A LASER DIODE EXPOSED TO RAYLEIGH BACKSCATTER FROM A SINGLE-MODE FIBER

被引:12
作者
MARK, J [1 ]
BODTKER, E [1 ]
TROMBORG, B [1 ]
机构
[1] TELECOMMUN RES LAB,DK-2200 COPENHAGEN,DENMARK
关键词
D O I
10.1049/el:19850716
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1010 / 1011
页数:2
相关论文
共 6 条
  • [1] EICKHOFF W, 1981, 3RD P INT C INT OPT, P76
  • [2] EPWORTH RE, 1984, 10TH EUR C OPT COMM, P132
  • [3] MEASUREMENT OF RAYLEIGH BACKSCATTER-INDUCED LINEWIDTH REDUCTION
    MARK, J
    BODTKER, E
    TROMBORG, B
    [J]. ELECTRONICS LETTERS, 1985, 21 (22) : 1008 - 1009
  • [4] MARK J, 1985, 5TH IOOC 11TH ECOC V
  • [5] MATHEMATICAL ANALYSIS OF RANDOM NOISE
    RICE, SO
    [J]. BELL SYSTEM TECHNICAL JOURNAL, 1945, 24 (01): : 46 - 156
  • [6] STABILITY ANALYSIS FOR A SEMICONDUCTOR-LASER IN AN EXTERNAL CAVITY
    TROMBORG, B
    OSMUNDSEN, JH
    OLESEN, H
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1984, 20 (09) : 1023 - 1032