MEASUREMENT OF RAYLEIGH BACKSCATTER-INDUCED LINEWIDTH REDUCTION

被引：30

作者：

MARK, J ^{[1
]}

BODTKER, E ^{[1
]}

TROMBORG, B ^{[1
]}

机构：

[1] TELECOMMUN RES LAB,DK-2200 COPENHAGEN,DENMARK

来源：

ELECTRONICS LETTERS | 1985年 / 21卷 / 22期

关键词：

D O I：

10.1049/el:19850714

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

6

引用

收藏

页码：1008 / 1009

页数：2

相关论文

共 6 条

[1] EPWORTH RE, 1984, 10TH EUR C OPT COMM, P132
[2] QUANTUM PHASE NOISE AND FIELD CORRELATION IN SINGLE FREQUENCY SEMICONDUCTOR-LASER SYSTEMS
GALLION, PB
DEBARGE, G
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1984, 20 (04) : 343 - 349
[3] STATISTICAL CHARACTERISTICS OF A LASER DIODE EXPOSED TO RAYLEIGH BACKSCATTER FROM A SINGLE-MODE FIBER
MARK, J
BODTKER, E
TROMBORG, B
[J]. ELECTRONICS LETTERS, 1985, 21 (22) : 1010 - 1011
[4] MARK J, 1985, 5TH IOOC 11TH ECOC V
[5] MATHEMATICAL ANALYSIS OF RANDOM NOISE
RICE, SO
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1945, 24 (01): : 46 - 156
[6] STABILITY ANALYSIS FOR A SEMICONDUCTOR-LASER IN AN EXTERNAL CAVITY
TROMBORG, B
OSMUNDSEN, JH
OLESEN, H
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1984, 20 (09) : 1023 - 1032