ELECTROREFLECTANCE INVESTIGATION OF (GA1-XALX)0.47IN0.53AS LATTICE MATCHED TO INP

被引：27

作者：

PARAYANTHAL, P ^{[1
]}

RO, CS ^{[1
]}

POLLAK, FH ^{[1
]}

STANLEY, CR ^{[1
]}

WICKS, GW ^{[1
]}

EASTMAN, LF ^{[1
]}

机构：

[1] CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853

来源：

APPLIED PHYSICS LETTERS | 1983年 / 43卷 / 01期

关键词：

D O I：

10.1063/1.94146

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：109 / 111

页数：3

共 18 条

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[6] ELECTROREFLECTANCE INVESTIGATION OF IN1-XGAXASYP1-Y LATTICE-MATCHED TO INP [J].

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POLLAK, FH ;

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POLLACK, MA .

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JOURNAL OF CRYSTAL GROWTH, 1981, 54 (02) :232-238

[9] COMPOSITIONAL DEPENDENCE OF BAND-GAP ENERGY AND CONDUCTION-BAND EFFECTIVE MASS OF IN1-X-YGAXALY AS LATTICE MATCHED TO INP [J].

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[10]

PARAYANTHAL P, UNPUB

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