X-RAY CHARACTERIZATION OF AMORPHOUS MULTILAYERS

被引：17

作者：

KADIN, AM

KEEM, JE

机构：

[1] Energy Conversion Devices Inc, Troy,, MI, USA, Energy Conversion Devices Inc, Troy, MI, USA

来源：

SCRIPTA METALLURGICA | 1986年 / 20卷 / 04期

关键词：

D O I：

10.1016/0036-9748(86)90234-6

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：443 / 450

页数：8

共 19 条

[1]

Barbee TW, 1985, P SPIE, V563, P2, DOI [10.1117/12.949647, DOI 10.1117/12.949647]

[2]

GREER L, 1985, SYNTHETIC MULTILAYER, P419

[3]

Henke B. L., 1982, Atomic Data and Nuclear Data Tables, V27, P1, DOI 10.1016/0092-640X(82)90002-X

[4]

Henke B. L., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P201, DOI 10.1117/12.949669

[5]

KADIN A, UNPUB

[6]

KADIN AM, 1985, B AM PHYS SOC, V30, P349

[7] X-RAY-DIFFRACTION IN MULTILAYERS [J].

LEE, P .

LEPETRE, Y ;

RASIGNI, G .

[9]

Lepetre Y., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P258

[10]

MARSHALL GF, 1985, P SPIE, V563