CHARACTERIZATION OF LAYERED SYNTHETIC MICROSTRUCTURE BY TRANSMISSION ELECTRON-MICROSCOPY AND DIFFRACTION

被引：34

作者：

LEPETRE, Y

RASIGNI, G

机构：

来源：

关键词：

D O I：

10.1364/OL.9.000433

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：433 / 434

页数：2

共 8 条

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LEPETRE, Y
CHARAI, A
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[4] NEW CLASS OF LAYERED MATERIALS
SCHULLER, IK
[J]. PHYSICAL REVIEW LETTERS, 1980, 44 (24) : 1597 - 1600
[5] Spiller E., 1981, AIP C P, V75, P124
[6] SPILLER E, 1980, ANN NY ACAD SCI, V342, P188
[7] LAYERED SYNTHETIC MICROSTRUCTURES AS BRAGG DIFFRACTORS FOR X-RAYS AND EXTREME ULTRAVIOLET - THEORY AND PREDICTED PERFORMANCE
UNDERWOOD, JH
BARBEE, TW
[J]. APPLIED OPTICS, 1981, 20 (17): : 3027 - 3034
[8] WHITLOCK RR, 1981, AIP C P, V75, P334