MULTILAYERS OBSERVED BY TRANSMISSION ELECTRON-MICROSCOPY

[1] BARBEE TW, 1981, APPL OPT, V17, P3027

[2] Deubner W, 1930, ANN PHYS-BERLIN, V5, P261

[3] X-RAY DIFFRACTION BY MULTILAYERED THIN-FILM STRUCTURES AND THEIR DIFFUSION [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (09) : 3781 - &

[4] An X-ray method of determining rates of diffusion in the solid state [J]. JOURNAL OF APPLIED PHYSICS, 1940, 11 (05) : 357 - 365

[5] MULTILAYER INTERFERENCE MIRRORS FOR XUV RANGE AROUND 100 EV PHOTON ENERGY [J]. OPTICS COMMUNICATIONS, 1976, 17 (03) : 287 - 292

[6] KOEPPE H, 1929, THESIS GIESSEN

[7] LEPETRE Y, 1982, VIDE COUCHES MINCES, V212, P303

[8] PALMIER JF, 1981, ECHO RECHERCHES CNET, V105, P41

[9] REFLECTIVE MULTILAYER COATINGS FOR FAR UV REGION [J]. APPLIED OPTICS, 1976, 15 (10): : 2333 - 2338

[10] TRILLAT JJ, 1957, B SOC FR MINERAL CRI, V53, P67

[1] BARBEE TW, 1981, APPL OPT, V17, P3027

[2] Deubner W, 1930, ANN PHYS-BERLIN, V5, P261

[3] X-RAY DIFFRACTION BY MULTILAYERED THIN-FILM STRUCTURES AND THEIR DIFFUSION [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (09) : 3781 - &

[4] An X-ray method of determining rates of diffusion in the solid state [J]. JOURNAL OF APPLIED PHYSICS, 1940, 11 (05) : 357 - 365

[5] MULTILAYER INTERFERENCE MIRRORS FOR XUV RANGE AROUND 100 EV PHOTON ENERGY [J]. OPTICS COMMUNICATIONS, 1976, 17 (03) : 287 - 292

[6] KOEPPE H, 1929, THESIS GIESSEN

[7] LEPETRE Y, 1982, VIDE COUCHES MINCES, V212, P303

[8] PALMIER JF, 1981, ECHO RECHERCHES CNET, V105, P41

[9] REFLECTIVE MULTILAYER COATINGS FOR FAR UV REGION [J]. APPLIED OPTICS, 1976, 15 (10): : 2333 - 2338

[10] TRILLAT JJ, 1957, B SOC FR MINERAL CRI, V53, P67