REFLECTIVE MULTILAYER COATINGS FOR FAR UV REGION

[1] INTERFERENCE FILTERS FOR FAR ULTRAVIOLET (1700 A TO 2400 A) [J]. APPLIED OPTICS, 1966, 5 (06): : 971 - &

[2] REFLECTANCE AND TRANSMITTANCE OF EVAPORATED ALUMINUM AND ALUMINUM - MAGNESIUM FLUORIDE FILMS IN ULTRAVIOLET (]1800 A) [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (04) : 481 - &

[3] CHANG LL, 1975, EPITAXIAL GROWTH A, P37

[4] Cho A. Y., 1975, Progress in Solid State Chemistry, V10, P157, DOI 10.1016/0079-6786(75)90005-9

[5] REPLICATION OF 0.1-MUM GEOMETRIES WITH X-RAY LITHOGRAPHY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1332 - 1335

[6] MULTILAYER INTERFERENCE MIRRORS FOR XUV RANGE AROUND 100 EV PHOTON ENERGY [J]. OPTICS COMMUNICATIONS, 1976, 17 (03) : 287 - 292

[7] HAGEMANN HJ, 1975, J OPT SOC AM, V65, P742, DOI 10.1364/JOSA.65.000742

[8] PHOTOABSORPTION COEFFICIENT OF ALLOYS OF AL WITH TRANSITION-METALS V, FE, NI AND WITH CU AND PR FROM 30 TO 150 EV PHOTON ENERGY [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1976, 74 (02): : 507 - 521

[9] HASS G, 1974, 1972 P ICOIX SANT MO, P525

[10] MONITORING THICKNESS OF THIN MGF2 AND LIF FILMS ON AL BY REFLECTANCE MEASUREMENTS USING 1216-A LINE OF HYDROGEN [J]. APPLIED OPTICS, 1972, 11 (07) : 1590 - +

[1] INTERFERENCE FILTERS FOR FAR ULTRAVIOLET (1700 A TO 2400 A) [J]. APPLIED OPTICS, 1966, 5 (06): : 971 - &

[2] REFLECTANCE AND TRANSMITTANCE OF EVAPORATED ALUMINUM AND ALUMINUM - MAGNESIUM FLUORIDE FILMS IN ULTRAVIOLET (]1800 A) [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (04) : 481 - &

[3] CHANG LL, 1975, EPITAXIAL GROWTH A, P37

[4] Cho A. Y., 1975, Progress in Solid State Chemistry, V10, P157, DOI 10.1016/0079-6786(75)90005-9

[5] REPLICATION OF 0.1-MUM GEOMETRIES WITH X-RAY LITHOGRAPHY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1332 - 1335

[6] MULTILAYER INTERFERENCE MIRRORS FOR XUV RANGE AROUND 100 EV PHOTON ENERGY [J]. OPTICS COMMUNICATIONS, 1976, 17 (03) : 287 - 292

[7] HAGEMANN HJ, 1975, J OPT SOC AM, V65, P742, DOI 10.1364/JOSA.65.000742

[8] PHOTOABSORPTION COEFFICIENT OF ALLOYS OF AL WITH TRANSITION-METALS V, FE, NI AND WITH CU AND PR FROM 30 TO 150 EV PHOTON ENERGY [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1976, 74 (02): : 507 - 521

[9] HASS G, 1974, 1972 P ICOIX SANT MO, P525

[10] MONITORING THICKNESS OF THIN MGF2 AND LIF FILMS ON AL BY REFLECTANCE MEASUREMENTS USING 1216-A LINE OF HYDROGEN [J]. APPLIED OPTICS, 1972, 11 (07) : 1590 - +