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GROWTH OF SINGLE-CRYSTALLINE COSI2 ON (111) SI IN SOLID-PHASE EPITAXY REGIME BY A NON-ULTRAHIGH VACUUM METHOD
被引:11
作者
:
CHENG, HC
论文数:
0
引用数:
0
h-index:
0
机构:
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
CHENG, HC
[
1
]
WU, IC
论文数:
0
引用数:
0
h-index:
0
机构:
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
WU, IC
[
1
]
CHEN, LJ
论文数:
0
引用数:
0
h-index:
0
机构:
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
CHEN, LJ
[
1
]
机构
:
[1]
NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
来源
:
APPLIED PHYSICS LETTERS
|
1987年
/ 50卷
/ 04期
关键词
:
D O I
:
10.1063/1.97652
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:174 / 176
页数:3
相关论文
共 14 条
[11]
SCHOTTKY-BARRIER FORMATION AT SINGLE-CRYSTAL METAL-SEMICONDUCTOR INTERFACES
[J].
TUNG, RT
论文数:
0
引用数:
0
h-index:
0
TUNG, RT
.
PHYSICAL REVIEW LETTERS,
1984,
52
(06)
:461
-464
[12]
LIQUID-PHASE GROWTH OF EPITAXIAL NI AND CO SILICIDES
[J].
TUNG, RT
论文数:
0
引用数:
0
h-index:
0
TUNG, RT
;
GIBSON, JM
论文数:
0
引用数:
0
h-index:
0
GIBSON, JM
;
JACOBSON, DC
论文数:
0
引用数:
0
h-index:
0
JACOBSON, DC
;
POATE, JM
论文数:
0
引用数:
0
h-index:
0
POATE, JM
.
APPLIED PHYSICS LETTERS,
1983,
43
(05)
:476
-478
[13]
TUNG RT, 1986, MATER RES SOC S P, V54, P457
[14]
STRUCTURAL CHARACTERIZATION BY TRANSMISSION ELECTRON-MICROSCOPY OF SILICON GROWN OVER SUBMICROMETER-PERIOD GRATINGS OF DEPOSITED TUNGSTEN
[J].
VOJAK, BA
论文数:
0
引用数:
0
h-index:
0
VOJAK, BA
;
RATHMAN, DD
论文数:
0
引用数:
0
h-index:
0
RATHMAN, DD
;
BURNS, JA
论文数:
0
引用数:
0
h-index:
0
BURNS, JA
;
CABRAL, SM
论文数:
0
引用数:
0
h-index:
0
CABRAL, SM
;
EFREMOW, NN
论文数:
0
引用数:
0
h-index:
0
EFREMOW, NN
.
APPLIED PHYSICS LETTERS,
1984,
44
(02)
:223
-225
←
1
2
→
共 14 条
[11]
SCHOTTKY-BARRIER FORMATION AT SINGLE-CRYSTAL METAL-SEMICONDUCTOR INTERFACES
[J].
TUNG, RT
论文数:
0
引用数:
0
h-index:
0
TUNG, RT
.
PHYSICAL REVIEW LETTERS,
1984,
52
(06)
:461
-464
[12]
LIQUID-PHASE GROWTH OF EPITAXIAL NI AND CO SILICIDES
[J].
TUNG, RT
论文数:
0
引用数:
0
h-index:
0
TUNG, RT
;
GIBSON, JM
论文数:
0
引用数:
0
h-index:
0
GIBSON, JM
;
JACOBSON, DC
论文数:
0
引用数:
0
h-index:
0
JACOBSON, DC
;
POATE, JM
论文数:
0
引用数:
0
h-index:
0
POATE, JM
.
APPLIED PHYSICS LETTERS,
1983,
43
(05)
:476
-478
[13]
TUNG RT, 1986, MATER RES SOC S P, V54, P457
[14]
STRUCTURAL CHARACTERIZATION BY TRANSMISSION ELECTRON-MICROSCOPY OF SILICON GROWN OVER SUBMICROMETER-PERIOD GRATINGS OF DEPOSITED TUNGSTEN
[J].
VOJAK, BA
论文数:
0
引用数:
0
h-index:
0
VOJAK, BA
;
RATHMAN, DD
论文数:
0
引用数:
0
h-index:
0
RATHMAN, DD
;
BURNS, JA
论文数:
0
引用数:
0
h-index:
0
BURNS, JA
;
CABRAL, SM
论文数:
0
引用数:
0
h-index:
0
CABRAL, SM
;
EFREMOW, NN
论文数:
0
引用数:
0
h-index:
0
EFREMOW, NN
.
APPLIED PHYSICS LETTERS,
1984,
44
(02)
:223
-225
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1
2
→