STEM MICROANALYSIS BY TRANSMISSION ELECTRON-ENERGY LOSS SPECTROSCOPY IN CRYSTALS

被引：29

作者：

SPENCE, JCH

LYNCH, J

机构：

来源：

ULTRAMICROSCOPY | 1982年 / 9卷 / 03期

关键词：

D O I：

10.1016/0304-3991(82)90211-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：267 / 276

页数：10

共 15 条

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