OPTICAL CONSTANTS OF THIN FILMS FROM THE CHARACTERISTIC ELECTRON ENERGY LOSSES

被引:25
作者
LAVILLA, RE
MENDLOWITZ, H
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JOURNAL DE PHYSIQUE | 1964年 / 25卷 / 1-2期
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D O I
10.1051/jphys:01964002501-2011400
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学科分类号
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页码:114 / 118
页数:5
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共 31 条
[21]  
MADDEN RP, 1963, PHYS THIN FILMS, V1, P123
[22]   PLURAL SCATTERING OF 20-KEV ELECTRONS IN ALUMINUM [J].
MARTON, L ;
SWANSON, N ;
SIMPSON, JA ;
FOWLER, HA .
PHYSICAL REVIEW, 1962, 126 (01) :182-&
[23]   ELECTRON ABSORPTION SPECTROMETER USING AN IMPROVED VELOCITY ANALYZER [J].
MARTON, L ;
SIMPSON, JA .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1958, 29 (07) :567-570
[24]  
MARTON L, 1955, ADV ELECTRON, V7, P183
[25]   OPTICAL TRANSMISSIVITY AND CHARACTERISTIC ENERGY LOSSES [J].
MENDLOWITZ, H .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (07) :739-740
[26]   OPTICAL CONSTANTS OF ALUMINIUM [J].
MENDLOWITZ, H .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1960, 75 (485) :664-670
[27]   OPTIMIZED METHOD FOR CORRECTING SMEARING ABERRATIONS - COMPLEX X-RAY SPECTRA [J].
PORTEUS, JO .
JOURNAL OF APPLIED PHYSICS, 1962, 33 (02) :700-&
[28]   CORRECTION OF SPECTROSCOPIC LINE PROFILES FOR INSTRUMENTAL BROADENING BY A FOURIER ANALYSIS METHOD [J].
ROLLETT, JS ;
HIGGS, LA .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1962, 79 (507) :87-&
[29]   A NUMERICAL FOURIER-ANALYSIS METHOD FOR THE CORRECTION OF WIDTHS AND SHAPES OF LINES ON X-RAY POWDER PHOTOGRAPHS [J].
STOKES, AR .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1948, 61 (346) :382-391
[30]  
SWANSON N, 1963, J CHEM PHYSICS, V39, P430