APPLICATION OF THE CHANNELING AND X-RAY-DIFFRACTION TECHNIQUES FOR DEFECT ANALYSIS

被引：3

作者：

KAUFMANN, R

LINKER, G

MEYER, O

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)91058-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：647 / 651

页数：5

相关论文

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