COMPOSITIONAL MAPPING IN BIOLOGY - X-RAYS AND ELECTRONS

被引：33

作者：

SOMLYO, AP ^{[1
]}

机构：

[1] UNIV PENN,SCH MED,PENN MUSCLE INST,DEPT PATHOL,PHILADELPHIA,PA 19104

来源：

JOURNAL OF ULTRASTRUCTURE RESEARCH | 1984年 / 88卷 / 02期

关键词：

D O I：

10.1016/S0022-5320(84)80005-2

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 [理学]; 0710 [生物学]; 09 [农学];

摘要：

引用

页码：135 / 142

页数：8

共 44 条

[1]

STEM STUDIES OF BIOLOGICAL STRUCTURE [J].

BEER, M ;

WIGGINS, JW ;

STOECKERT, CJ ;

MARENUS, K ;

KUHN, E ;

ERICKSON, M .

ULTRAMICROSCOPY, 1982, 8 (1-2) :207-218

[2]

CRYSTALLOGRAPHIC ORIENTATION EFFECTS IN ENERGY DISPERSIVE-X-RAY ANALYSIS [J].

BOURDILLON, AJ ;

SELF, PG ;

STOBBS, WM .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 44 (06) :1335-1350

[3]

HEAVY METAL-CONTAINING SURROUNDINGS PROVIDE MUCH MORE NEGATIVE CONTRAST BY Z-IMAGING IN STEM THAN WITH CONVENTIONAL MODES [J].

CARLEMALM, E ;

ACETARIN, JD ;

VILLIGER, W ;

COLLIEX, C ;

KELLENBERGER, E .

JOURNAL OF ULTRASTRUCTURE RESEARCH, 1982, 80 (03) :339-343

[4]

CASTAING R, 1967, FOCUSING CHARGED PAR, P256

[5]

CONDENSER APERTURE MISALIGNMENT AND SOLUTE PROFILE ASYMMETRIES IN STEM X-RAY-MICROANALYSIS [J].

CLIFF, G .

JOURNAL OF MICROSCOPY-OXFORD, 1983, 130 (MAY) :RP3-RP4

[6]

COLLIEX C, 1982, J MICROSC SPECT ELEC, V7, P525

[7]

COLLIEX C, ADV OPTICAL ELECTRON

[8]

SCANNING-TRANSMISSION ELECTRON-MICROSCOPY OF THIN SPECIMENS [J].

COWLEY, JM .

ULTRAMICROSCOPY, 1976, 2 (01) :3-16

[9]

STEM IMAGING OF THICK SPECIMENS WITH OFF-AXIS DETECTORS [J].

COWLEY, JM .

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1984, 1 (01) :83-94

[10]

HIGH RESOLUTION ELECTRON SPECTROMETER FOR USE IN TRANSMISSION SCANNING ELECTRON MICROSCOPY [J].

CREWE, AV ;

ISAACSON, M ;

JOHNSON, D .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (04) :411-&

← 1 2 3 4 5 →