THE PHASE-SHIFTING MASK .2. IMAGING SIMULATIONS AND SUBMICROMETER RESIST EXPOSURES

被引:61
作者
LEVENSON, MD [1 ]
GOODMAN, DS [1 ]
LINDSEY, S [1 ]
BAYER, PW [1 ]
SANTINI, HAE [1 ]
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
关键词
D O I
10.1109/T-ED.1984.21603
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:753 / 763
页数:11
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[3]   IMPROVING RESOLUTION IN PHOTOLITHOGRAPHY WITH A PHASE-SHIFTING MASK [J].
LEVENSON, MD ;
VISWANATHAN, NS ;
SIMPSON, RA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (12) :1828-1836
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LIN BJ, 1979, SPIE, V174, P114
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