INTERFACIAL ROUGHNESS IN INAS/GAAS HETEROSTRUCTURES DETERMINED BY SOFT-X-RAY REFLECTIVITY

被引：10

作者：

WORONICK, SC ^{[1
]}

YANG, BX ^{[1
]}

KROL, A ^{[1
]}

KAO, YH ^{[1
]}

MUNEKATA, H ^{[1
]}

CHANG, LL ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

JOURNAL OF APPLIED PHYSICS | 1989年 / 66卷 / 08期

关键词：

D O I：

10.1063/1.344086

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3566 / 3573

页数：8

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