SEU FLIGHT DATA FROM THE CRRES MEP

被引：17

作者：

CAMPBELL, AB

机构：

[1] Naval Research Laboratory, Washington

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1991年 / 38卷 / 06期

关键词：

D O I：

10.1109/23.124158

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Analysis of single event upset data from the CRRES MEP from 27 July 1990 through 26 March 1991 has shown that upsets are being observed each orbit, the 93422 and 93L422 bipolar RAMs are the most sensitive devices, proton upsets in the radiation belts predominate over cosmic ray upsets, and many devices exhibit multiple bit upsets.

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收藏

页码：1647 / 1654

页数：8

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